Optical Measurement Techniques for Characterization of MEMS Devices
2012-02-06 08:36:12 来源：MEMS Investor Journal 评论：0 点击：
Are you working to optimize the performance of your MEMS device? Learn how Polytec's latest technology is used to characterize MEMS devices for real-world applications.
Subject: Webinar: Optical Measurement Techniques for Characterization of MEMS Devices
Date: Wednesday, February 8th, 2012
Time: 9 AM PST / 12PM EST
Sign up for free today!
http://tinyurl.com/77xrycm
Abstract: Are you working to optimize the performance of your MEMS device? Learn how Polytec's latest technology is used to characterize MEMS devices for real-world applications. Our Micro System Analyzer (MSA-500) combines powerful tools for analysis and visualization of structural vibration of MEMS. This features Laser Doppler Vibrometry for measurement of out-of-plane motion with resolution down to picometers and bandwidth out to GHz.
Scanning Vibrometer measurements provide full-field mapping and 3D visualization of deflection shapes. By adding stroboscopic video microscopy, we are able to extend our measurement capability to the in-plane direction for complete 3D motion analysis. We present application studies where our tools have been instrumental in the design and development of MEMS. Join this web presentation to find out what Polytec can do for you.
Speaker: Eric Lawrence, MEMS Business Development
Learn more about Polytec’s Microsystem Analyzers by visiting our web site: http://www.polytec.com/us/products/microsystem-mems-analyzers.
MEMS Application Page: http://www.polytec.com/us/applications/micro-nano-technology.
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